Analog Devices’ MEMS Accelerometers Enable Early Detection of Structural Defects

Analog Devices, Inc. (ADI) today announced three-axis, MEMS accelerometers that perform high resolution vibration measurement with very low noise to enable the early detection of structural defects via wireless sensor networks. The low power consumption of the new ADXL354 and ADXL355 accelerometers lengthens battery life and allows extended product usage by reducing the time between Read more about Analog Devices’ MEMS Accelerometers Enable Early Detection of Structural Defects[…]